High efficiency core-shell nanowires and their characterisation by X-ray diffraction

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dc.contributor.authorKurtuluş, Özgül
dc.contributor.authorPietsch, Ullrich
dc.date.accessioned2019-12-03T20:38:27Z
dc.date.available2019-12-03T20:38:27Z
dc.date.issued2009en_US
dc.departmentDoğuş Üniversitesi, Fen Edebiyat Fakültesi, Fizik Bölümüen_US
dc.descriptionKurtuluş, Özgül (Dogus Author) -- Conference full title: 25th European Crystallographic Meeting, ECM 25, İstanbul: Turkey, 2009.en_US
dc.description.abstractThe controlled organisation of nano-materials in arrays of confinements with regular spacings is a key issue in fabricating functional nanodevices. Structural characterisation of these materials is essential for understanding their physical properties and evaluating their future applications in nano-electronics.en_US
dc.identifier.citationKurtuluş, O., & Pietsch, U. (2009). High efficiency core-shell nanowires and their characterisation by X-ray diffraction. Acta Crystallographica Section A: Foundations and Advances, 65, 339. http://dx.doi.org/ 10.1107/S0108767309092770en_US
dc.identifier.doi10.1107/S0108767309092770
dc.identifier.endpage339en_US
dc.identifier.issn2053-2733
dc.identifier.other000480362900722 (WOS)
dc.identifier.startpage339en_US
dc.identifier.urihttp://dx.doi.org/ 10.1107/S0108767309092770
dc.identifier.urihttps://hdl.handle.net/11376/3438
dc.identifier.volume65en_US
dc.identifier.wosWOS:000480362900722en_US
dc.identifier.wosqualityN/Aen_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.institutionauthorKurtuluş, Özgül
dc.language.isoenen_US
dc.publisherInternational Union of Crystallographyen_US
dc.relation.ispartofActa Crystallographica Section A: Foundations and Advancesen_US
dc.relation.publicationcategoryDiğeren_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.rights.urihttp://creativecommons.org/licenses/by/3.0/us/*
dc.subjectNanostructuresen_US
dc.subjectChalcogenidesen_US
dc.subjectPowder X-ray Diffractionen_US
dc.titleHigh efficiency core-shell nanowires and their characterisation by X-ray diffractionen_US
dc.typeOtheren_US

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