Root-mean-square measurement of distinct voltage signals
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CitationYüce, E., Minaei, S., & Tokat, S. (2007). Root-mean-square measurement of distinct voltage signals. IEEE Transactions on Instrumentation and Measurement, 56(6), 2782-2787. http://dx.doi.org/10.1109/TIM.2007.908153
A circuit for measuring the root-mean-square (RMS) value of N distinct voltage signals, which employs two second-generation current conveyors and 2N + 1 metal-oxide-semiconductor transistors, is presented. The proposed circuit can find applications in measuring the RMS value of the output error signal of an artificial neural network (ANN). The presented network can also be used for realizing half- and full-wave rectifications. The proposed circuit does not use resistances and capacitances; therefore, it can operate at high frequencies. The results of the calculations are verified using SPICE simulations.