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dc.contributor.authorGöknar, İzzet Cem
dc.date.accessioned2014-11-21T19:07:59Z
dc.date.available2014-11-21T19:07:59Z
dc.date.issued2008-10
dc.identifier.citationGÖKNAR, İ.C. (2008). Models and modeling: be careful and use your imagination. IEEE Antennas and Propagation Magazine, Volume 50, Issue 5, pp.215-221.en_US
dc.identifier.issn1045-9243
dc.identifier.other10324503 (INSPEC)
dc.identifier.urihttp://dx.doi.org/10.1109/MAP.2008.4674763
dc.identifier.urihttp://hdl.handle.net/11376/692
dc.description.abstractWhen not soldering, engineers continuously deal with models when analyzing, designing, and implementing. There are two phases in modeling: utilization, and creation. Model utilization is common practice, and does not necessitate further comment other than "make the right choice and use the model carefully." The tutorial addresses the first phase briefly and shows how erroneous results may occur when care is not exercised. The second phase is much more subtle: it requires delicate measurements, extreme perception, and/or excellent imagination. Memnristors and memnristive systems, a perfect illustration of "using imagination," are presented and discussed at length. Their recent realization as a nano-chip by HP is a very good example of "history repeating itself," and proof of how "an electrical element that was postulated almost fifty years ago to exist, became a reality." The tutorial concludes with some reactions to and comments about this new device.en_US
dc.description.sponsorshipIEEE Antennas and Propagation Societyen_US
dc.language.isoengen_US
dc.publisherIEEEen_US
dc.relation.isversionof10.1109/MAP.2008.4674763en_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectModelingen_US
dc.subjectMemnristorsen_US
dc.subjectMemnristive Systemsen_US
dc.titleModels and modeling: be careful and use your imaginationen_US
dc.typearticleen_US
dc.relation.journalIEEE Antennas and Propagation Magazineen_US
dc.contributor.departmentDoğuş Üniversitesi, Mühendislik Fakültesi, Elektronik ve Haberleşme Mühendisliği Bölümüen_US
dc.contributor.authorIDTR143818en_US
dc.identifier.volume50en_US
dc.identifier.issue5en_US
dc.identifier.startpage215en_US
dc.identifier.endpage221en_US


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